DocumentCode :
1898878
Title :
Hybrid Hall microsystem for high dynamic range/large bandwidth magnetometry applications
Author :
Kerlain, Alexandre ; Mosser, Vincent
Author_Institution :
ITRON SAS, Malakoff
fYear :
2008
fDate :
26-29 Oct. 2008
Firstpage :
1044
Lastpage :
1047
Abstract :
We have developed a hybrid magnetometer combining a high performance III-V semiconductor based Hall sensor with a purposely developed specific IC using a mixed-mode 0.35 mum CMOS process. The ASIC fulfills several functions: analog signal processing (4-phase spinning current modulation) providing an efficient low-frequency noise reduction, reference voltage generation, Sigma-Delta based AD conversion and demodulation, digital filter blocks and serial output management. The signal bandwidth can be set between 1 and 1500 Hz. The equivalent input noise is practically flat (i.e. free from 1/f noise) in the 0.1 Hz-1.5 kHz frequency range, and amounts to 100-150 nT/radicHz. A large dynamic has been demonstrated, the total error being less than 0.2% of the measured value in 3.5 decades of signal amplitude. This study exemplifies the interest of hybrid technology for sensing in general, featuring integrated functionalities in standard low cost CMOS IC with high performance non silicon sensors.
Keywords :
CMOS integrated circuits; Hall effect devices; III-V semiconductors; application specific integrated circuits; demodulation; digital filters; magnetometers; sigma-delta modulation; ASIC; CMOS IC; Hall sensor; Sigma-Delta based AD conversion; analog signal processing; bandwidth 1 Hz to 1500 Hz; demodulation; digital filter; frequency 0.1 Hz to 1.5 kHz; hybrid Hall microsystem; hybrid magnetometer; noise reduction; reference voltage generation; serial output management; Bandwidth; CMOS integrated circuits; Dynamic range; Hybrid integrated circuits; III-V semiconductor materials; Low-frequency noise; Magnetic semiconductors; Magnetic sensors; Magnetometers; Semiconductor device noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2008 IEEE
Conference_Location :
Lecce
ISSN :
1930-0395
Print_ISBN :
978-1-4244-2580-8
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2008.4716622
Filename :
4716622
Link To Document :
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