• DocumentCode
    1898928
  • Title

    Development of a Standard Test Program Set Cost Model

  • Author

    Borrero, Mauricio ; Deffler, Jim

  • Author_Institution
    Naval Air Warfare Center Aircraft Div., Lakehurst, NJ, USA
  • fYear
    1997
  • fDate
    22-25 Sep 1997
  • Firstpage
    278
  • Lastpage
    284
  • Abstract
    The S_tandard T_est Program Set C_ost M_odel (STCM) is an integrated model suite being developed jointly by Naval Air Warfare Center Aircraft Division Lakehurst (NAWCAD LKE), Naval Aviation Depot Jacksonville (NAOEP JAX), and Test Automation Incorporated (TAI) to provide government agencies with a tool to perform consistent TPS cost estimating across multiple Automatic Test System (ATS) platforms. Through the World Wide Web, STCM will provide the government Test Program Set (TPS) Program Manager(PM) with a comprehensive tool for TPS cost estimating, forecasting, and tracking by capitalizing on the unique capabilities of the following existing software tools for TPS cost estimation and ATS analysis: (i) NAWCAD LKE system synthesis model plus (SSM+) (ii) NADEP JAX Should-Cost TPS Cost Estimate Model (iii) NADEP JAX Auto-ID Merge Model (iv) TAI Cost Asset Schedule Prediction Evaluation Routine (CASPER)
  • Keywords
    Internet; aircraft testing; automatic test equipment; integrated software; military standards; software tools; technological forecasting; NADEP JAX Auto-ID Merge Model; NADEP JAX Should-Cost TPS Cost Estimate Model; NAWCAD LKE system synthesis model; Naval Air Warfare Center; Naval Aviation Depot; TAI Cost Asset Schedule Prediction Evaluation Routine; TPS cost estimating; Test Automation Incorporated; World Wide Web; cost estimation; forecasting; integrated model suite; multiple automatic test system platforms; software tools; standard test program set cost model; Aircraft; Automatic testing; Automation; Costs; Government; Lakes; Performance evaluation; Predictive models; Standards development; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-4162-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.1997.633629
  • Filename
    633629