Aging monitoring with local sensors in FPGA-based designs

In nanoscale FPGAs, variability and aging significantly limit performance. In this paper, a novel aging monitoring methodology for FPGA-based designs to mitigate those effects is proposed. Local sensors are embedded in the configured functionality, monitoring critical paths, at production or during product lifetime. No design freeze (slice and routing locked) is required. When sensors observe a user´s defined time guardband violation, safe operation is endangered and action can be triggered, either to reduce clock frequency or to increase core V_DD. Simulation and experimental results are presented, using Spartan 6 boards and vendor tools. The testbench uses a Data Acquisition (DAQ) system with Triple Modular Redundancy (TMR) architecture and a Built-In Self-Test (BIST) infrastructure. It is shown that local sensors will anticipate system failure. Various devices are also used to analyze sensitivity to process variations.