DocumentCode :
1899153
Title :
An Analytical model for the Above threshold Characteristics of Polysilicon Thin Film Transistors
Author :
Horng Nan Chern ; Chung Len Lee ; Tan Fu Lei
fYear :
1993
fDate :
6-7 March 1993
Firstpage :
67
Keywords :
Analytical models; Circuit synthesis; Design optimization; Electron traps; Grain boundaries; Tail; Temperature distribution; Thin film devices; Thin film transistors; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Modeling & Simulation, 1993. SMS Technical Digest. 1993 Symposium on
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-1225-2
Type :
conf
DOI :
10.1109/SMS.1993.664560
Filename :
664560
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1899153
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