Title :
The association of solderability testing with board level soldering performance automatic optical inspection (AOI)
Author :
Kwoka, Mark A. ; Mullenix, Paul D.
Author_Institution :
Harris Semicond., Melbourne, FL, USA
Abstract :
The authors address the issue of agreement of visual board-level solderability with visual methods after solder-dipping or wetting-balance methods. A description of visual dip-and-look solderability test methodology along with wetting-balance principles and their use in solderability assessment for components is presented. The specific dip-and-look visual requirements, wetting-balance measures, and board-level solder-joint criteria used are discussed along with the strategy employed. The authors describe the experimental technique used, including the equipment, materials, and the details of the component sample preparations. Dip-and-look visual solderability assessment and wetting-balance measures are compared with actual board-level soldering performance. The ability of the various assessment methods to predict board-level defects is also explored. Recommendations in this area are given
Keywords :
automatic optical inspection; printed circuit testing; soldering; assessment methods; automatic optical inspection; board level soldering performance; component sample preparations; dip-and-look solderability test; solder-dipping; solder-joint criteria; solderability testing; visual board-level solderability; wetting-balance methods; Assembly; Automatic optical inspection; Automatic testing; Electronic components; Electronic equipment testing; Lead; Military standards; Semiconductor device testing; Soldering; Termination of employment;
Conference_Titel :
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location :
Las Vegas, NV
DOI :
10.1109/ECTC.1990.122258