DocumentCode
189965
Title
Capillary optofluidics by high-aspect-ratio photonic crystals
Author
Surdo, S. ; Strambini, L.M. ; Barillaro, G. ; Carpignano, F. ; Merlo, S.
Author_Institution
Dipt. di Ing. dell´Inf., Univ. di Pisa, Pisa, Italy
fYear
2014
fDate
2-5 Nov. 2014
Firstpage
1395
Lastpage
1398
Abstract
In this work, vertical, silicon/air one-dimensional photonic crystals (1DPhCs) are proposed as sensing elements for capillary optofluidics. As proof-of-concept, a drop-and-measure optofluidic platform that integrates a 1DPhC operating in the near-infrared region into a simple capillary microfluidic network is reported. The platform is fabricated by silicon electrochemical micromachining (ECM) technology and is optically characterized by measuring the shift of 1DPhC refelctivity upon capillary infiltration of liquids with different refractive indices into the PhC air-gaps. Experimental measures highlight that high reproducibility, good linearity, high sensitivity, and good limit of detection are achieved under capillary operation, thus foreseeing a novel generation of drop-and-measure platforms for refractometry/chemical analysis making use of PhCs.
Keywords
capillarity; electrochemical machining; elemental semiconductors; micro-optomechanical devices; microfluidics; micromachining; microsensors; optical fabrication; optical sensors; photonic crystals; reflectivity; silicon; ECM; capillary optofluidics; chemical analysis; detection limit; drop-and-measure platforms; high-aspect-ratio photonic crystals; linearity; near-infrared region; one-dimensional photonic crystals; reflectivity; refractive indices; refractometry; reproducibility; sensing elements; sensitivity; silicon electrochemical micromachining; simple capillary microfluidic network; vertical silicon-air 1DPhC; Ethanol; Liquids; Microfluidics; Optical reflection; Optical variables measurement; Photonic crystals; Silicon; Capillarity; Drop-and-Measure Platform; Photonic Crystals; Refractometry;
fLanguage
English
Publisher
ieee
Conference_Titel
SENSORS, 2014 IEEE
Conference_Location
Valencia
Type
conf
DOI
10.1109/ICSENS.2014.6985273
Filename
6985273
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