• DocumentCode
    1899710
  • Title

    A geometric framework method for voltage stability analysis based on sensitivity analysis

  • Author

    Zhang, Xu ; Flueck, Alexander J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    2012
  • fDate
    9-11 Sept. 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper focuses on a new approach for contingency ranking with respect to saddle-node bifurcation induced voltage collapse. The proposed contingency ranking method has been done by estimating the post-contingency voltage collapse point (VCP), given pre-contingency VCP with forecasted load demand and generation dispatch. The features of the new approach are the abilities to estimate the post-contingency VCP directly with sensitivity analysis and rank contingency cases quickly and accurately for large power systems. The proposed method has been tested on the IEEE 118 bus system with 177 single branch outages (9 radial branches are skipped) and 18 single generator outages. Compared with results obtained from full continuation power flow, the new algorithm is shown to be twice as fast with “distance to voltage collapse” estimation errors of less than 1%.
  • Keywords
    bifurcation; load flow control; power generation dispatch; power system dynamic stability; sensitivity analysis; voltage control; IEEE 118 bus system; contingency ranking; contingency ranking method; continuation power flow; estimation errors; geometric framework method; large power systems; load demand forecasting; load generation dispatch; post-contingency voltage collapse point; precontingency VCP; rank contingency; saddle-node bifurcation induced voltage collapse; sensitivity analysis-based voltage stability analysis; single branch outages; Bifurcation; Generators; Loading; Power system stability; Sensitivity analysis; Stability analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    North American Power Symposium (NAPS), 2012
  • Conference_Location
    Champaign, IL
  • Print_ISBN
    978-1-4673-2306-2
  • Electronic_ISBN
    978-1-4673-2307-9
  • Type

    conf

  • DOI
    10.1109/NAPS.2012.6336323
  • Filename
    6336323