Title :
Development of a high speed data acquisition system based on LabVIEW(R) and VXI(R)
Author :
Deichert, Ronald L. ; Burris, Daniel P. ; Luckemeyer, James A.
Author_Institution :
Eng. Spectrum Inc., San Antonio, TX, USA
Abstract :
The collection of high speed, multi-channel test data in a VXI environment can be challenging, especially when the number of input channels is large and data processing is required for analysis of the test data. This paper describes a data acquisition system which was designed to acquire performance data on the Minuteman III MK12/W62 Re-entry Vehicle Nuclear Weapon Sub-System, as the Sub-System is functionally tested in a simulated flight test environment. The testing requires the simultaneous measurement of 53 channels of digital and analog data with a cumulative data capture rate of 100 kHz. The data is used to evaluate the reliability of the test specimen, using a post-processing algorithm. To further complicate the acquisition and post-test processing, the signals under measurement are interrelated in that some signals act as triggering events for other signals. The solution presented in this paper is a VXI-based data acquisition instrument operating with a PC running a LabVIEW(R) application while using an MXI interface for data transfer between the VXI and PC buses. The software element of this system uses a uniquely developed data analysis tool. The analysis tool, named Data ScoreTM, is programmed in a scripting language to allow test engineers the ability to define signal interrelations and data processing algorithms. The graphical user interface provides a flexible ability to view either post-test or archived data
Keywords :
aerospace simulation; aerospace testing; data acquisition; military systems; missiles; peripheral interfaces; Data Score; LabVIEW; Minuteman III MK12/W62 Re-entry Vehicle Nuclear Weapon Sub-System; VXI; VXI-based data acquisition instrument; cumulative data capture rate; data analysis tool; graphical user interface; high speed data acquisition system; multi-channel test data; post-test processing; reliability; scripting language; signal interrelations; simulated flight test environment; triggering events; Aerospace simulation; Application software; Data acquisition; Data analysis; Data processing; Instruments; Nuclear weapons; Signal processing; System testing; Vehicles;
Conference_Titel :
AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-4162-7
DOI :
10.1109/AUTEST.1997.633633