• DocumentCode
    1899876
  • Title

    Charge transfer and reentrant phenomenon in deuterated (DMe-DCNQI)/sub 2/Cu

  • Author

    Sawa, H. ; Tamura, Masato ; Aonuma, S. ; Kinoshita, Moto ; Kato, Ryota

  • Author_Institution
    Univ. of Tokyo
  • fYear
    1994
  • fDate
    24-29 July 1994
  • Firstpage
    406
  • Lastpage
    406
  • Keywords
    Charge carrier processes; Charge transfer; Conductors; Electrons; Insulation; Lattices; Metal-insulator structures; Physics; Solid state circuits; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
  • Conference_Location
    Seoul, Korea
  • Type

    conf

  • DOI
    10.1109/STSM.1994.835544
  • Filename
    835544
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1899876