DocumentCode :
1900165
Title :
Development of a Framework for Automated Systematic Testing of Safety-Critical Embedded Systems
Author :
Kandl, Susanne ; Kirner, Raimund ; Puschner, Peter
Author_Institution :
Inst. fur Technische Informatik, Technische Univ. Wien
fYear :
2006
fDate :
30-30 June 2006
Firstpage :
1
Lastpage :
13
Abstract :
In this paper we introduce the development of a framework for testing safety-critical embedded systems based on the concepts of model-based testing. In model-based testing the test cases are derived from a model of the system under test. In our approach the model is an automaton model that is automatically extracted from the C-source code of the system under test. Beside random test data generation the test case generation uses formal methods, in detail model checking techniques. To find appropriate test cases we use the requirements defined in the system specification. To cover further execution paths we developed an additional, to our best knowledge, novel method based on special structural coverage criteria. We present preliminary results on the model extraction using a concrete industrial case study from the automotive domain
Keywords :
embedded systems; formal specification; formal verification; program testing; safety-critical software; automated systematic testing; automaton model; formal methods; model checking; model extraction; model-based testing; random test data generation; safety-critical embedded systems; system specification; system under test; test case generation; Aerospace safety; Aerospace testing; Automata; Automatic testing; Automotive engineering; Concrete; Data mining; Embedded system; Software systems; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Solutions in Embedded Systems, 2006 International Workshop on
Conference_Location :
Vienna
Print_ISBN :
3-902463-06-6
Type :
conf
DOI :
10.1109/WISES.2006.329116
Filename :
4125767
Link To Document :
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