• DocumentCode
    1900293
  • Title

    New oblique thin wire formalism in the FDTD method

  • Author

    Guiffaut, Ch ; Reineix, A. ; Pecqueux, B.

  • Author_Institution
    XLIM Inst., Univ. of Limoges, Limoges, France
  • fYear
    2010
  • fDate
    11-17 July 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In the FDTD method, the Cartesian meshing is a critical point for conforming structures and small geometries. For thin wire formalism, one cumulates small section with a problem of conforming to the Yee´s cell and fast variation of both looping magnetic field and radial electric field close to the wire. Among all previous thin wire published models, only Holland´s approach has evolved toward inclined wires. Hence the works of Ledfelt and Edelvik show that it is possible to have a wire´s behaviour independent of its location in the Yee´s cell or its obliquity. Our new approach compared to is justified by the necessity to deal with a junction between several oblique wires. Indeed is not extended for multiwire junction because the coupling between the wire current and the electrical field uses a cylinder-shaped stencil with a section superior to the FDTD cell size and so it is too difficult to suit correctly to a junction with more than two wires. To avoid this problem, we propose a technique where the coupling between the wire and the FDTD meshing is limited to only the cells that contain a part of the wire.
  • Keywords
    electric fields; electromagnetic wave propagation; finite difference time-domain analysis; magnetic fields; mesh generation; FDTD method; Yee cell; cartesian meshing; conforming structure; cylinder-shaped stencil; magnetic field; multiwire junction; oblique thin wire formalism; radial electric field; Couplings; Equations; Finite difference methods; Junctions; Mathematical model; Time domain analysis; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium (APSURSI), 2010 IEEE
  • Conference_Location
    Toronto, ON
  • ISSN
    1522-3965
  • Print_ISBN
    978-1-4244-4967-5
  • Type

    conf

  • DOI
    10.1109/APS.2010.5562189
  • Filename
    5562189