DocumentCode
1900397
Title
A methodology for the interconnect performance evaluation of 2D and 3D processors with memory
Author
Chandra, Girish ; Kapur, Pawan ; Saraswat, Krishna C.
Author_Institution
Stanford Univ., CA, USA
fYear
2002
fDate
2002
Firstpage
164
Lastpage
166
Abstract
Stochastic wire length distribution models often overlook the presence of a large amount of on-chip memory, treating it as random logic. Based on layout considerations for the memory, a methodology for interconnect performance evaluation is proposed that takes the memory into account. It is shown that not taking the complete model can lead to erroneous results. The benefits of 3D integration are then evaluated with different possible arrangements of memory on different active layers.
Keywords
integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; integrated memory circuits; microprocessor chips; 2D processors; 3D integration; 3D processors; active layers; interconnect model; interconnect performance evaluation; memory layout considerations; on-chip memory; random logic; stochastic wire length distribution models; Conductors; Distributed computing; Logic; Microprocessors; Performance analysis; Routing; Stochastic processes; Wire; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Interconnect Technology Conference, 2002. Proceedings of the IEEE 2002 International
Print_ISBN
0-7803-7216-6
Type
conf
DOI
10.1109/IITC.2002.1014921
Filename
1014921
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