Title :
Part 3: Off Chip Communication and Testing
Author :
Schettler, Helmut
Keywords :
Circuit testing; Delay; Driver circuits; Impedance; Logic testing; Packaging; Read-write memory; Switches; Switching circuits; System testing;
Conference_Titel :
Solid State Circuits Conference, 1981. ESSCIRC '81. 7th European
Conference_Location :
Freiburg, F. R. Germany
