Title :
A CMOS Image Sensor with row and column profiling means
Author :
Xie, Ning ; Theuwissen, Albert J P ; Wang, Xinyang ; Leijtens, Johan ; Hakkesteegt, Henk ; Jansen, Henk
Author_Institution :
Delft Univ. of Technol., Delft
Abstract :
This paper describes the implementation and first measurement results of a new way that obtains row and column profile data from a CMOS Image Sensor, which is developed for a micro-Digital Sun Sensor (muDSS).The basic profiling action is achieved by the pixels with p-type MOS transistors which realize a so-called ldquoWinner Takes It All (WTIA)rdquo principle. The WTIA implementation improves the muDSS system greatly on speed and power consumption. In this way the sensor is ideally suited for a digital sun sensor intended for astronomy applications.
Keywords :
CMOS image sensors; CMOS image sensor; basic profiling action; column profile data; column profiling mean; microdigital sun sensor; p-type MOS transistors; row profile data; row profiling mean; Biomembranes; CMOS image sensors; Decision support systems; Energy consumption; Image sensors; Pixel; Satellites; Sensor arrays; Sensor systems; Sun;
Conference_Titel :
Sensors, 2008 IEEE
Conference_Location :
Lecce
Print_ISBN :
978-1-4244-2580-8
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2008.4716697