Title :
Fast prediction for conducted EMI in flyback converters
Author :
Jianwei Liu ; Yi Wang ; Dan Jiang ; Qunsheng Cao
Author_Institution :
Coll. of Electron. & Inf. Eng., Nanjing Univ. of Aeronaut. & Astronaut., Nanjing, China
Abstract :
The flyback switched mode power supply often fails in electromagnetic compatibility (EMC) because of the easily aroused conducted electromagnetic interference (EMI). However, the measurement of conducted EMI during initial compliance tests requires strict test environments and expensive facilities, this makes the prediction of EMI important. This paper presents a time domain simulation method to predict the conducted EMI of a flyback converter before prototyping. The CST PCB Studio is utilized to extract parasitic parameters of a printed circuit board (PCB) based on 2D field solver and perform total circuit simulation. Experimental results validate that the presented modeling method is efficient and fast to predict EMI.
Keywords :
AC-DC power convertors; conformance testing; electromagnetic compatibility; electromagnetic interference; printed circuits; switched mode power supplies; time-domain analysis; 2D field solver; AC-DC power conversion; CST PCB Studio; EMC; compliance tests; electromagnetic compatibility; electromagnetic interference; fast conducted EMI prediction; flyback converters; flyback switched mode power supply; parasitic parameter extraction; printed circuit board; time domain simulation method; total circuit simulation; Capacitance; Electromagnetic compatibility; Electromagnetic interference; Integrated circuit modeling; Noise; Predictive models; Switched-mode power supply; AC-DC power conversion; EMC; EMI; Electromagnetic conductive interference; Prediction methods;
Conference_Titel :
Computational Electromagnetics (ICCEM), 2015 IEEE International Conference on
Conference_Location :
Hong Kong
DOI :
10.1109/COMPEM.2015.7052622