Title :
The Impact of Testing on VLSI Design Methods
Author_Institution :
Philips Research Laboratories, Eindhoven, The Netherlands
Abstract :
The question ``why design for testability?´´ will be answered by discussing some existing test philosophies. Exhaustive testing, functional testing and structural testing will be treated, also with regard to their usefulness for VLSI circuits. There is no general agreement on how to design for testability. Various approaches exist, and each has its specific applications. Some of these approaches will be discussed in detail, also regarding the influence of the complexity on necessary CAD tools for test pattern generation.
Keywords :
Design methodology; Testing; Very large scale integration;
Conference_Titel :
Solid State Circuits Conference, 1981. ESSCIRC '81. 7th European
Conference_Location :
Freiburg, F. R. Germany
