Title :
Optimizing the Simulation Speed of QEMU and SystemC-Based Virtual Platform
Author :
Yeh, Tse-Chen ; Lin, Zin-Yuan ; Chiang, Ming-Chao
Author_Institution :
Dept. of Comput. Sci. & Eng., Nat. Sun Yat-sen Univ., Kaohsiung, Taiwan
Abstract :
In this paper, we present a technique for optimizing the simulation speed of the QEMU and SystemC-based virtual platform.Most of the optimization methods for conventional instruction set simulator based virtual platforms focus on accelerating the simulator kernel. However, the bottleneck that affects the simulation speed of a virtual machine based virtual platform is not necessarily the simulator kernel. In order to better understand the bottleneck, we investigate the QEMU and SystemC-based virtual platform,by using it to boot up a full-fledged Linux with data movement via DMA controller model at the instruction-accurate and cycle-count-accurate levels. Based on the outcome, we propose a method to optimize its simulation speed. Compared to the original version, the optimized version can boost up the simulation speed of instruction-accurate simulator by a factor of 1.153 and the simulation speed of cycle-count-accurate simulator with different bus arbitration policies by a factor of 1.354 or 1.390,thus making the virtual platform even more suitable for electronic system level (ESL) design flow.
Keywords :
Linux; digital simulation; logic design; system-on-chip; virtual machines; DMA controller model; DMA cycle-count-accurate level; DMA instruction-accurate level; Linux; QEMU-based virtual platform; SystemC-based virtual platform; bus arbitration policy; cycle-count-accurate simulator; electronic system level design flow; optimization methods; simulation speed; virtual machine; Analytical models; Computational modeling; Delay; Hardware; Integrated circuit modeling; Kernel; System-on-a-chip;
Conference_Titel :
Information Engineering and Computer Science (ICIECS), 2010 2nd International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-7939-9
Electronic_ISBN :
2156-7379
DOI :
10.1109/ICIECS.2010.5678362