DocumentCode
1901490
Title
Multiphase imide block copolymers: new materials for microelectronics applications
Author
Labadie, J.W. ; Hedrick, James L.
Author_Institution
IBM Almaden Res. Center, San Jose, CA, USA
fYear
1990
fDate
20-23 May 1990
Firstpage
706
Abstract
Imide block copolymers were investigated as a means of lowering the dielectric constant and improving the polymer-polymer adhesion of poly(4,4´-oxydiphenylenepyromellitimide) (PMDA/ODA). Poly(perfluoroalkylenearyl ether) (PFAAE) was used as a coblock to introduce fluorine and lower the dielectric constant of PMDA/ODA. Poly(aryl ether-phenylquinoxaline) (PQE) coblocks were incorporated to improve polymer-polymer adhesion, since conventional poly(phenylquinoxalines) are known to be excellent hot melt adhesives. The preparation of imide copolymers required the use of poly(amic ester), rather than poly(amic acids), as the imide precursor. PFAAE and PQE were selected as coblocks due to their compatibility with the solvents required for the poly(amic ester) synthesis and processing as well as their excellent thermal stability and mechanical properties. The copolymers could be processed and cured with conventional techniques to afford high-quality coatings. The block copolymers showed excellent final properties, including high dimensional stability and tough, ductile mechanical properties. The materials displayed a heterogeneous morphology with submicron domains of PFAAE or PQE in a polyimide matrix. The PFAAE copolymers showed a reduction in dielectric constant relative to PMDA/ODA (ε≈2.8), and the copolymers of PMDA/ODA with ≈15-wt.% PQE showed excellent self-adhesion, as predicted
Keywords
insulating thin films; permittivity; polymer blends; polymer films; PFAAE; PMDA/ODA; PQE; block copolymers; coblock; dielectric constant; heterogeneous morphology; high dimensional stability; imide copolymers; imide precursor; mechanical properties; microelectronics applications; polymer-polymer adhesion; submicron domains; thermal stability; Adhesives; Coatings; Dielectric constant; Dielectric materials; Mechanical factors; Morphology; Polyimides; Polymers; Solvents; Thermal stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location
Las Vegas, NV
Type
conf
DOI
10.1109/ECTC.1990.122267
Filename
122267
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