Technology considerations for automotive

Author

Casier, Herman ; Moens, Peter ; Appeltans, Koen

Author_Institution

AMI Semicond. Belgium BVBA, Oudenaarde, Belgium

fYear

2004

fDate

21-23 Sept. 2004

Firstpage

37

Lastpage

41

Abstract

In this paper, the evolution of automotive electronics and the specific electronics requirements posed by the automotive environment are discussed. Safety is a very dominant factor in automotive applications and this has a large impact on the required robustness of the electronics. As an example, DMOS optimization and ESD robustness considerations have led to the N-epi based structure of the AMIS I3T automotive technology. On top of the robust technology, innovative design techniques are described which further improve the robustness of the high voltage smart power applications for the harsh environment of the automotive electronics.

Keywords

MOS integrated circuits; automotive components; automotive electronics; circuit optimisation; electrostatic discharge; environmental degradation; integrated circuit reliability; power integrated circuits; safety; AMIS I3T automotive technology; DMOS optimization; ESD robustness; N-epi based structure; automotive electronics; automotive environment; automotive technology; design techniques; electronics robustness; harsh environment; high voltage smart power applications; safety; specific electronics requirements; Ambient intelligence; Automotive electronics; Automotive engineering; Batteries; Consumer electronics; Driver circuits; Electronic circuits; Power system reliability; Robustness; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research conference, 2004. ESSDERC 2004. Proceeding of the 34th European

Print_ISBN

0-7803-8478-4

Type

conf

DOI

10.1109/ESSDER.2004.1356480

Filename

1356480