Title :
Piezo resistive thin film sensor system
Author :
Biehl, Saskia ; Woitschach, Ole ; Staufenbiel, Sebastian ; Brill, Carsten
Author_Institution :
Fraunhofer Inst. for Surface Eng. & Thin Films, Braunschweig
Abstract :
This paper presents the latest investigations of thin film sensor developments based on amorphous hydrogenated carbon films. The piezo resistive layer is deposited in a plasma enhanced chemical vapour deposition process in a thickness of 4-6 mum. The advantage of this film is a excellent tribological behaviour with a hardness of 20-40 GPa and a coefficient of friction of 0,2 as it is well known from the diamond like carbon layers [1,2,3] combined with a piezo resistive characteristic [4]. This layer can detect loads without the need of elongation. A special sensor system in the shape of a washer can be easily integrated in screw joints to detect the normal load distribution.
Keywords :
diamond-like carbon; friction; piezoresistive devices; plasma CVD; thin film sensors; amorphous hydrogenated carbon films; diamond like carbon layers; friction coefficient; normal load distribution; piezoresistive layer; piezoresistive sensor; plasma enhanced chemical vapour deposition; thin film sensor; tribological behaviour; Amorphous materials; Chemical processes; Chemical vapor deposition; Diamond-like carbon; Fasteners; Friction; Plasma chemistry; Sensor systems; Shape; Thin film sensors;
Conference_Titel :
Sensors, 2008 IEEE
Conference_Location :
Lecce
Print_ISBN :
978-1-4244-2580-8
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2008.4716749