Title :
Application of memory tester for non-destructive detection of micro-crack and crack patterns in flash memory devices
Author :
Phurikhup, Surasit ; Pruettipongsapuk, Sommart ; Sirivathanant, Krisada
Author_Institution :
Device Anal. Lab., Adv. Micro Devices Ltd., Nonthaburi, Thailand
Abstract :
In this paper, we introduces a new , non-destructive inspection technique for die crack and crack pattern using a memory tester. The concept of the technique is based upon the fact that almost ninety percent of the space of a memory device consists of cell memories, thus if microcrack is present, the phenomenon would cause malfunctioning of the memory.
Keywords :
acoustic microscopy; flash memories; microcracks; crack patterns; die crack; flash memory devices; memory tester; microcrack; nondestructive detection; Acoustic measurements; Acoustic signal detection; Flash memory; Inspection; Integrated circuit packaging; Microelectronics; Nondestructive testing; Nonvolatile memory; Semiconductor device packaging; Threshold voltage;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2003. IPFA 2003. Proceedings of the 10th International Symposium on the
Print_ISBN :
0-7803-7722-2
DOI :
10.1109/IPFA.2003.1222743