Title :
The Impact of VLSI on the European Electronics Industry
Author :
Brinker, C.S.den ; Mackintosh, I.M.
Keywords :
Circuit testing; Economic forecasting; Electronics industry; Environmental economics; Industrial economics; Integrated circuit technology; Integrated circuit testing; Very large scale integration;
Conference_Titel :
Solid State Circuits Conference, 1977. ESSCIRC '77. 3rd European
Conference_Location :
Ulm, F.R. Germany
