• DocumentCode
    1902474
  • Title

    A new approach to the self-consistent solution of the Schrodinger-Poisson equations in nanowire MOSFETs

  • Author

    Gnani, E. ; Reggiani, S. ; Rudan, M. ; Baccarani, G.

  • Author_Institution
    DEIS, Bologna Univ., Italy
  • fYear
    2004
  • fDate
    21-23 Sept. 2004
  • Firstpage
    177
  • Lastpage
    180
  • Abstract
    In this work, we investigate the electrostatics of fully-depleted cylindrical nanowire (CNW) MOSFETs accounting for quantum effects and, in doing so, we propose a new approach for the self-consistent solution of the Schrodinger-Poisson equations based on a rigorous time-independent perturbation approach. The strength of this method is that the Schrodinger equation is solved in a semi-analytical form, thus eliminating discretization errors and providing very accurate energy eigenvalues and eigenfunctions: furthermore, the computation time is cut down by an order of magnitude. A major result of this investigation is that the ON/OFF current ratio increases as the diameter of the CNW-MOSFET is scaled down. This makes them good candidates for an advanced low-leakage CMOS technology. The above technique is finally used to investigate the influence of high-κ gate dielectrics on the electrostatics of CNW-MOSFETs, indicating that an improved performance is achieved, though not as large as one would expect from the κ ratio.
  • Keywords
    MOSFET; Poisson equation; Schrodinger equation; dielectric thin films; eigenvalues and eigenfunctions; leakage currents; nanoelectronics; nanowires; semiconductor device models; CNW-MOSFET diameter; ON/OFF current ratio; Schrodinger-Poisson equations; cylidrical nanowire MOSFET; electrostatics; energy eigenfunctions; energy eigenvalues; fully-depleted MOSFET; high-k gate dielectrics; low-leakage CMOS technology; quantum effects; time-independent perturbation method; CMOS technology; Dielectrics; Eigenvalues and eigenfunctions; Electric potential; Electrostatics; FinFETs; MOSFETs; Poisson equations; Quantum mechanics; Schrodinger equation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research conference, 2004. ESSDERC 2004. Proceeding of the 34th European
  • Print_ISBN
    0-7803-8478-4
  • Type

    conf

  • DOI
    10.1109/ESSDER.2004.1356518
  • Filename
    1356518