DocumentCode :
1902745
Title :
CMOS-compatible vertical MOSFETs and logic gates with reduced parasitic capacitance
Author :
Kunz, V.D. ; de Groot, C.H. ; Gili, E. ; Uchino, T. ; Hall, S. ; Ashburn, P.
Author_Institution :
Dept. of Electron. & Comput. Sci., Southampton Univ., UK
fYear :
2004
fDate :
21-23 Sept. 2004
Firstpage :
221
Lastpage :
224
Abstract :
This paper reports electrical results on CMOS-compatible vertical transistors and logic gates with reduced overlap capacitance. It is shown that surround-gate MOSFETs, produced using the fillet local oxidation process (FILOX), have lower gate/drain overlap capacitance and consume less silicon area than comparable lateral MOSFETs. Novel logic gate structures, based on partially removing the polysilicon surround gate, are described and characterised.
Keywords :
MOSFET; logic gates; oxidation; CMOS logic gates; CMOS-compatible MOSFET; FILOX; NAND gates; NOR gates; fillet local oxidation process; gate/drain overlap capacitance; overlap capacitance reduction; parasitic capacitance reduction; polysilicon surround gate partial removal; surround-gate MOSFET; vertical MOSFET; Computer science; Epitaxial growth; Etching; Fabrication; Lithography; Logic devices; Logic gates; MOSFETs; Parasitic capacitance; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research conference, 2004. ESSDERC 2004. Proceeding of the 34th European
Print_ISBN :
0-7803-8478-4
Type :
conf
DOI :
10.1109/ESSDER.2004.1356529
Filename :
1356529
Link To Document :
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