Title :
Classification using Extended Morphological Attribute Profiles based on different feature extraction techniques
Author :
Peeters, Stijn ; Marpu, Prashanth R. ; Benediktsson, Jón A. ; Mura, Mauro Dalla
Author_Institution :
Phys. Dept., Univ. of Antwerp, Antwerp, Belgium
Abstract :
Extended Morphological Attribute Profiles (EAPs) are extension of Extended Morphological Profiles (EMPs). They are based on the more general Morphological Attribute Profiles (APs) rather than the conventional Morphological Profiles (MPs). EAPs are computed on few of the first principle components (PCs) extracted from the multi-/hyper-spectral data. In this paper, we propose to compute EAPs on features derived from supervised feature extraction techniques such as discriminant analysis feature extraction (DAFE), decision boundary feature extraction (DBFE) and non-parametric weighted feature extraction (NWFE)) instead of using unsupervised principal component analysis (PCA).
Keywords :
feature extraction; geophysical image processing; geophysical techniques; image classification; principal component analysis; decision boundary feature extraction; discriminant analysis feature extraction technique; extended morphological attribute profile; feature extraction technique; hyperspectral data analysis; image classification; multispectral data analysis; nonparametric weighted feature extraction; principal component analysis; Accuracy; Educational institutions; Feature extraction; Hyperspectral imaging; Iron; Principal component analysis; Attribute profiles; classification; feature extraction; hyperspectral images;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2011 IEEE International
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1003-2
DOI :
10.1109/IGARSS.2011.6050221