DocumentCode :
1902966
Title :
A New Approach for Testing Ultra Fast A/D-Converters
Author :
Pretzl, Günter
Author_Institution :
Lehrstuhl fÿr Technische Elektronik, Universitÿt Erlangen-Nÿrnberg, Erlangen, W.-Germany
fYear :
1977
fDate :
20-22 Sept. 1977
Firstpage :
142
Lastpage :
145
Abstract :
Digital techniques are proposed to determine the transfer characteristics of ADCs under dynamic operating conditions. Specifications such as signal-to-noise ratio and differential nonlinearity are derived. Measurements show the discrepancy between static and dynamic performance.
Keywords :
Analog-digital conversion; Feeds; Frequency; Oscilloscopes; Pulse generation; Quantization; Sampling methods; Signal generators; Signal to noise ratio; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Circuits Conference, 1977. ESSCIRC '77. 3rd European
Conference_Location :
Ulm, F.R. Germany
Print_ISBN :
380071132X
Type :
conf
Filename :
5435095
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1902966
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