• DocumentCode
    1903071
  • Title

    Extremely reliable bonding of large silicon dice using gold-tin alloy

  • Author

    Matijasevic, Goran S. ; Wang, Chen Y. ; Lee, Chin C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
  • fYear
    1990
  • fDate
    20-23 May 1990
  • Firstpage
    786
  • Abstract
    Large silicon dice have been bonded on alumina substrates with Au-Sn eutectic using a novel bonding technique. The bonding quality was examined by a scanning acoustic microscope (SAM) having a resolution of 20 μm. Nearly perfect bondings have been achieved. Au-Sn alloy was chosen rather than the commonly used Au-Si alloy because the lower eutectic point of the Au-Sn system would result not only in lower processing temperature but also lower stress on the dice. The die-bonded specimens endured 40 cycles of thermal shock between -196°C and +160°C without cracking or bond degradation despite the significant mismatch of thermal expansion coefficients between silicon and alumina. Storage tests at -196°C and +250°C also do not induce cracking or bond degradation. Pull-test results indicate that the bondings are stronger than the silicon dice themselves
  • Keywords
    acoustic microscopy; alumina; gold alloys; integrated circuit technology; microassembling; silicon; thermal shock; -196 to 160 degC; Al2O3; Si-AuSn-Al2O3; bonding technique; die-bonded specimens; eutectic point; processing temperature; pull tests; scanning acoustic microscope; stress; thermal expansion coefficients; thermal shock; Bonding; Electric shock; Gold alloys; Microscopy; Plastics; Silicon alloys; Temperature; Thermal conductivity; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1990. ., 40th
  • Conference_Location
    Las Vegas, NV
  • Type

    conf

  • DOI
    10.1109/ECTC.1990.122279
  • Filename
    122279