DocumentCode :
1903071
Title :
Extremely reliable bonding of large silicon dice using gold-tin alloy
Author :
Matijasevic, Goran S. ; Wang, Chen Y. ; Lee, Chin C.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
fYear :
1990
fDate :
20-23 May 1990
Firstpage :
786
Abstract :
Large silicon dice have been bonded on alumina substrates with Au-Sn eutectic using a novel bonding technique. The bonding quality was examined by a scanning acoustic microscope (SAM) having a resolution of 20 μm. Nearly perfect bondings have been achieved. Au-Sn alloy was chosen rather than the commonly used Au-Si alloy because the lower eutectic point of the Au-Sn system would result not only in lower processing temperature but also lower stress on the dice. The die-bonded specimens endured 40 cycles of thermal shock between -196°C and +160°C without cracking or bond degradation despite the significant mismatch of thermal expansion coefficients between silicon and alumina. Storage tests at -196°C and +250°C also do not induce cracking or bond degradation. Pull-test results indicate that the bondings are stronger than the silicon dice themselves
Keywords :
acoustic microscopy; alumina; gold alloys; integrated circuit technology; microassembling; silicon; thermal shock; -196 to 160 degC; Al2O3; Si-AuSn-Al2O3; bonding technique; die-bonded specimens; eutectic point; processing temperature; pull tests; scanning acoustic microscope; stress; thermal expansion coefficients; thermal shock; Bonding; Electric shock; Gold alloys; Microscopy; Plastics; Silicon alloys; Temperature; Thermal conductivity; Thermal expansion; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location :
Las Vegas, NV
Type :
conf
DOI :
10.1109/ECTC.1990.122279
Filename :
122279
Link To Document :
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