• DocumentCode
    190317
  • Title

    Speed optimized large area avalanche photodetector in standard CMOS technology for visible light communication

  • Author

    Ray, Sagar ; Hella, Mona M. ; Hossain, Md Mottaleb ; Zarkesh-Ha, Payman ; Hayat, Majeed M.

  • Author_Institution
    Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    2014
  • fDate
    2-5 Nov. 2014
  • Firstpage
    2147
  • Lastpage
    2150
  • Abstract
    This paper presents a speed-optimized large area avalanche photodetector (APD) in standard CMOS technology for visible light communication applications (VLC). Recent research efforts have reported high speed CMOS APDs with low breakdown voltage for considerably small photodiode sizes, which limits the APD usage in low cost optical receivers for VLC. The speed of a large-area APD dramatically decreases due to increased transit time of diffusive carriers in charge neutral regions. The proposed technique divides the active area into multiple sub-sections to decrease transit time and increase speed. A prototype 350×350 μm2 APD is fabricated in 0.13-μm CMOS technology. The photodetector achieves a maximum gain of 7.6 K at 11 V reverse bias, showing excellent agreement with simulation results as calculated using the nonlocal impact ionization model based on recursive dead-space multiplication theory (DSMT). 2-D device level simulations validate the speed enhancement by comparing the small signal simulation results of three P+/N-well photodiodes with the same area detector composed of different number of sub-sections.
  • Keywords
    CMOS integrated circuits; avalanche photodiodes; impact ionisation; photodetectors; semiconductor device breakdown; semiconductor device models; 2D device level simulations; breakdown voltage; nonlocal impact ionization model; p-n well photodiodes; recursive dead-space multiplication theory; size 0.13 mum; speed enhancement; speed-optimized large area avalanche photodetector; standard CMOS technology; visible light communication applications; voltage 11 V; Avalanche photodiodes; CMOS integrated circuits; CMOS technology; Junctions; Noise; Optical receivers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SENSORS, 2014 IEEE
  • Conference_Location
    Valencia
  • Type

    conf

  • DOI
    10.1109/ICSENS.2014.6985463
  • Filename
    6985463