DocumentCode :
190327
Title :
Incident light angle detection technique using polarization pixels
Author :
Varghese, Vigil ; Shoushun Chen
Author_Institution :
VIRTUS IC Design Centre of Excellence, Nanyang Technol. Univ., Singapore, Singapore
fYear :
2014
fDate :
2-5 Nov. 2014
Firstpage :
2167
Lastpage :
2170
Abstract :
In this paper we present the design and analysis of a CMOS image sensor pixel capable of detecting the angle of incident light. Determining the angle is of paramount importance in reconstructing the 3D information of the imaged scene. These pixels achieve this by including polarization gratings on top of the photodiodes in each pixel. Three different pixels, each with different grating orientation produce enough information to determine the local incidence angle. Because of the symmetric nature of the response for positive and negative angles, another set of pixels, called the linear quadrature pixel cluster has been included to break the symmetry and provide greater angle resolution.We present the simulation results as well as the design, which is targeted towards GlobalFoundries 65 nm CMOS mixed-signal process.
Keywords :
CMOS image sensors; angular measurement; image reconstruction; light polarisation; photodiodes; 3D image reconstruction; CMOS image sensor; CMOS mixed-signal process; incident light angle detection technique; linear quadrature pixel cluster; photodiodes; polarization gratings; polarization pixels; size 65 nm; Gratings; Light sources; Metals; Photodiodes; Sensitivity; Three-dimensional displays; Wires; CMOS image sensor; Polarization detection; angle estimation; linear quadrature pixel cluster;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SENSORS, 2014 IEEE
Conference_Location :
Valencia
Type :
conf
DOI :
10.1109/ICSENS.2014.6985468
Filename :
6985468
Link To Document :
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