Title :
SiC Growth and Its Application to High-Speed Si-HBTs
Author :
Sugii, T. ; Yamazaki, T. ; Arimoto, Y. ; Ito, T. ; Furumura, Y. ; Namura, I. ; Goto, H. ; Tahara, A.
Author_Institution :
Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-01, Japan
Abstract :
This paper discusses the limitations of a conventional poly-Si emitter for sub 0.5¿m bipolar transistors and presents a breakthrough using a heterojunction at the emitter-base junction with an SiCx widegap emitter. Both SiCx widegap emitter HBTs and poly-Si emitter transistors with comparable device structures are examined. Low base resistance was achieved using a 1Ã1019/cm3 base dopant concentration, while retaining an acceptable current gain and suppressing forward-bias tunneling current using the SiCx emitter. A very thin , highly doped base was combined with the SiCx emitter to demonstrate high-speed capability.
Keywords :
Bipolar transistors; Cutoff frequency; Degradation; Delay effects; Heterojunction bipolar transistors; Laboratories; Material storage; Microelectronics; Silicon carbide; Tunneling;
Conference_Titel :
Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
Conference_Location :
Leuven, Belgium