DocumentCode :
1903326
Title :
Delay fault testability modeling with temporal logic
Author :
Westerman, G. ; Heath, J.R. ; Stroud, C.E.
Author_Institution :
Lexmark Int. Inc., Lexington, KY
fYear :
1997
fDate :
22-25 Sep 1997
Firstpage :
376
Lastpage :
382
Abstract :
To ensure the quality of manufactured integrated circuits, it is important that designs be delay fault testable. A formal verification technique such as temporal logic can help avoid the large cost of dynamic simulation. Temporal logic is a formalism for evaluating the temporal behavior of systems. STeP, Stanford Temporal Prover, is a system developed at Stanford University to support computer-aided formal verification of concurrent and reactive systems based on temporal logic specification. The application of temporal logic and STeP to delay fault testability modeling and analysis is presented
Keywords :
delays; design for testability; formal verification; integrated circuit modelling; integrated logic circuits; logic testing; temporal logic; STeP; Stanford Temporal Prover; computer-aided formal verification; concurrent and reactive systems; cost; delay fault testability modeling; dynamic simulation; fault testability analysis; fault testability modeling; formal verification; manufactured integrated circuits; reactive systems; temporal logic; temporal logic specification; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Costs; Delay; Formal verification; Integrated circuit manufacture; Integrated circuit testing; Logic testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-4162-7
Type :
conf
DOI :
10.1109/AUTEST.1997.633648
Filename :
633648
Link To Document :
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