Title :
Yield learning and the sources of profitability in high technology manufacturing and process development
Author_Institution :
Dept. of Eng. & Technol. Manage., Portland State Univ., OR, USA
Abstract :
A numerical model that identifies the high-leverage variables associated with profitability in high technology manufacturing is presented. Varying the parameters of the model demonstrates that a rapid yield-learning rate determines profitability more than any other factor does. Factors such as ramping up to production early, adding factory capacity, maximizing quality, and increasing the robustness of product designs all yield diminishing returns. The model also suggests the preparations in the early stages of process development are the key to successful yield learning.
Keywords :
integrated circuit yield; product design; product development; profitability; project management; semiconductor device manufacture; factory capacity; high technology manufacturing; leverage variables; process development; product design; quality; yield learning rate; Costs; Electronics industry; Integrated circuit modeling; Integrated circuit technology; Manufacturing processes; Production; Profitability; Semiconductor device manufacture; Semiconductor device modeling; Virtual manufacturing;
Conference_Titel :
Management of Engineering and Technology, 2003. PICMET '03. Technology Management for Reshaping the World. Portland International Conference on
Print_ISBN :
1-890843-08-3
DOI :
10.1109/PICMET.2003.1222802