Title :
A Novel Embedded OTP NVM Using Standard Foundry CMOS Logic Technology
Author :
Peng, J. ; Rosendale, G. ; Fliesler, M. ; Fong, D. ; Wang, J. ; Ng, C. ; Liu, Zs ; Luan, Harry
Author_Institution :
Kilopass Technol., Inc., Santa Clara, CA
Abstract :
A novel embedded one-time programmable (OTP) nonvolatile memory (NVM), using only standard Foundry CMOS logic technology, is described. IP modules with densities from 1Kb to 1Mb were constructed and tested. Reliability data is presented for 1Mb memory modules fabricated in 0.18mu technology
Keywords :
CMOS memory circuits; embedded systems; integrated circuit reliability; 0.18 micron; 1 Mbit; IP modules; embedded OTP NVM; gate oxide breakdown; memory modules; one-time programmable nonvolatile memory; reliability data; standard Foundry CMOS logic technology; CMOS logic circuits; CMOS process; CMOS technology; Costs; Electric breakdown; Foundries; Manufacturing; Nonvolatile memory; PROM; Voltage;
Conference_Titel :
Non-Volatile Semiconductor Memory Workshop, 2006. IEEE NVSMW 2006. 21st
Conference_Location :
Monterey, CA
Print_ISBN :
1-4244-0027-9
DOI :
10.1109/.2006.1629479
