• DocumentCode
    1903865
  • Title

    Improving the ambipolar behavior of Schottky barrier carbon nanotube field effect transistors

  • Author

    Pourfath, M. ; Ungersboeck, E. ; Gehring, A. ; Cheong, B.H. ; Park, W. ; Kosina, H. ; Selberherr, Siegfried

  • Author_Institution
    Inst. for Microelectron., Tech. Univ. Wien, Austria
  • fYear
    2004
  • fDate
    21-23 Sept. 2004
  • Firstpage
    429
  • Lastpage
    432
  • Abstract
    Due to the capability of ballistic transport, carbon nanotube field-effect transistors (CNTFETs) have been studied in recent years as a potential alternative to CMOS devices. CNTFETs can be fabricated with ohmic or Schottky type contacts. We focus here on Schottky barrier CNTFETs which operate by modulating the transmission coefficient of Schottky barriers at the contact between the metal and the carbon nanotube (CNT). The ambipolar behavior of Schottky barrier CNTFETs limits the performance of these devices. We show that a double gate design can suppress the ambipolar behavior considerably. In this structure, for an n-type device, the first gate which is near the source controls electron injection and the second gate which is near the drain suppresses hole injection. The voltage of the second gate can be set to a constant voltage or to the drain voltage. We investigated the effect of the second gate voltage on the performance of the device and finally discuss the advantages and disadvantages of these designs.
  • Keywords
    Schottky barriers; carbon nanotubes; field effect transistors; nanotube devices; semiconductor device models; C; CNT; CNTFET ambipolar behavior; Schottky barrier carbon nanotube FET; Schottky type contacts; ballistic transport; barrier transmission coefficient modulation; electron injection control; hole injection suppression; n-type double gate CNTFET; ohmic contacts; Ballistic transport; CMOS technology; CNTFETs; Carbon nanotubes; FETs; Materials science and technology; Microelectronics; Organic materials; Schottky barriers; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research conference, 2004. ESSDERC 2004. Proceeding of the 34th European
  • Print_ISBN
    0-7803-8478-4
  • Type

    conf

  • DOI
    10.1109/ESSDER.2004.1356582
  • Filename
    1356582