DocumentCode
1904032
Title
Ultra High Density HfO2 Nanodots Memory for Scaling
Author
Wakai, H. ; Kobayashi, M. ; Kumise, T. ; Yamaguchi, M. ; Nakanishi, T. ; Tanaka, H.
fYear
2006
fDate
2006
Firstpage
58
Lastpage
59
Keywords
Amorphous materials; Channel bank filters; Chemical vapor deposition; Crystallization; Hafnium oxide; Rapid thermal annealing; Semiconductor films; Temperature; Transistors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Non-Volatile Semiconductor Memory Workshop, 2006. IEEE NVSMW 2006. 21st
Conference_Location
Monterey, CA, USA
Print_ISBN
1-4244-0027-9
Type
conf
DOI
10.1109/.2006.1629493
Filename
1629493
Link To Document