• DocumentCode
    1904397
  • Title

    Application on Virtual Instrument and Neural Networks in the Fault Diagnosis

  • Author

    Zhang Minghu ; Wang Dehu ; Lv Shijun ; Song Yuxi ; Liu Hong ; Chen Shaojie

  • Author_Institution
    dept. of Shipboard Weaponry, Dalian Naval Acad., Dalian, China
  • Volume
    2
  • fYear
    2009
  • fDate
    10-11 Oct. 2009
  • Firstpage
    317
  • Lastpage
    320
  • Abstract
    The main point of intelligent fault diagnosis theory is fault mode distinguishing principle based on data processing methods. Pointing to the problems of the traditional fault diagnosis mode, a fault diagnosis method based on the virtual instrument and neural networks is proposed. The signals collection and management based on virtual instrument is introduced, the basic method of the neural networks for distinguishing the faults is analyzed. For fastness and accuracy, connecting the wavelet analysis with the neural networks organically, and based on the wavelet transfer and the neural networks, the system of the speedy features extraction and identification for the faults is founded. The method of the feature extraction for the faults based on the wavelet analysis are established, the realization idea of the fault diagnosis based on the neural networks is put forward, and the hardware and software structure of the fault diagnosis based on the neural networks are discussed. The experimental and simulated results show: it is feasible that analyses for the faults with the neural networks and the wavelet analysis. The method can remarkably heighten the accuracy and credibility of the fault diagnosis results, and the results are of repeatability.
  • Keywords
    fault diagnosis; feature extraction; neural nets; virtual instrumentation; wavelet transforms; data processing methods; fault diagnosis; fault identification; fault mode distinguishing principle; features extraction; neural networks; virtual instrument; wavelet analysis; wavelet transfer; Analytical models; Data processing; Fault diagnosis; Feature extraction; Instruments; Joining processes; Neural network hardware; Neural networks; Signal analysis; Wavelet analysis; design of hardware and software; fault model identification; feature extraction; neural networks; virtual instrument technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Computation Technology and Automation, 2009. ICICTA '09. Second International Conference on
  • Conference_Location
    Changsha, Hunan
  • Print_ISBN
    978-0-7695-3804-4
  • Type

    conf

  • DOI
    10.1109/ICICTA.2009.312
  • Filename
    5287995