DocumentCode :
1904646
Title :
FIT for EMC
Author :
Walter, Marko ; Munteanu, Irina
Author_Institution :
CST GmbH, Darmstadt
fYear :
2006
fDate :
Feb. 27 2006-March 3 2006
Firstpage :
15
Lastpage :
17
Abstract :
The paper describes developments of the finite integration technique (FIT) which offers benefits especially for the EMC community
Keywords :
electromagnetic compatibility; integration; EMC; FIT; finite integration technique; Computational modeling; Computer simulation; Electromagnetic compatibility; Finite difference methods; Frequency; Integral equations; Magnetic separation; Testing; Time domain analysis; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC-Zurich 2006. 17th International Zurich Symposium on
Conference_Location :
Singapore
Print_ISBN :
3-9522990-3-0
Type :
conf
DOI :
10.1109/EMCZUR.2006.214857
Filename :
1629547
Link To Document :
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