Title :
A fully integrated gearbox capacitive DC/DC-converter in 90nm CMOS: Optimization, control and measurements
Author :
Van Breussegem, Tom ; Steyaert, Michiel
Author_Institution :
ESAT-MICAS, K.U. Leuven, Heverlee, Belgium
Abstract :
This paper presents a fully integrated capacitive DC/DC-converter with a gearbox type topology. By merging multiple topologies the output voltage range is increased. The dual loop digital control improves load regulation compared with a conventional hysteretic control and reduces ripple under low load operation. The converter was implemented in a 90 nm CMOS technology and measurements are presented.
Keywords :
CMOS integrated circuits; DC-DC power convertors; digital control; CMOS technology; conventional hysteretic control; dual loop digital control; full integrated gearbox capacitive DC-DC converter; gearbox type topology; load regulation; ripple reduction; size 90 nm; Capacitors; Charge pumps; Converters; Impedance; Switching frequency; Topology; Voltage control;
Conference_Titel :
Control and Modeling for Power Electronics (COMPEL), 2010 IEEE 12th Workshop on
Conference_Location :
Boulder, CO
Print_ISBN :
978-1-4244-7462-2
Electronic_ISBN :
978-1-4244-7461-5
DOI :
10.1109/COMPEL.2010.5562379
