• DocumentCode
    1904724
  • Title

    Hard-switching in high power density voltage regulators

  • Author

    López, Toni ; Alarcón, Eduard

  • Author_Institution
    Philips Res. Labs., Aachen, Germany
  • fYear
    2010
  • fDate
    28-30 June 2010
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    The causes for which fast-hard-switching operation may differ from the traditional clamped inductive switching mode are mainly attributed to the parasitic loop inductances of PCB and device package as well as the parasitic output capacitances of the semiconductor switch. These parasitic elements form the basis of the proposed model, which fundamentally represents the dynamics of hard-switched converters targeted for high-switching frequency, high-current and low-voltage applications. The model is thus useful to investigate the switching behavior of the synchronous buck converter in one of the most currently challenging applications: Voltage regulators (VR) for modern computer microprocessors. The study reveals important design aspects required for the optimization of relevant circuit and device parameters at high switching frequency.
  • Keywords
    MOSFET; microprocessor chips; optimisation; printed circuits; semiconductor switches; switching convertors; voltage regulators; PCB; clamped inductive switching mode; computer microprocessors; device package; fast hard switching operation; hard-switched converters; high power density; optimization; parasitic loop inductance; semiconductor switch; synchronous buck converter; voltage regulators; Capacitance; Computational modeling; Integrated circuit modeling; Logic gates; Switches; Switching loss; Transient analysis; MOSFET model; SiP; hard-switching; high current; high power density; switching losses; voltage regulators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Modeling for Power Electronics (COMPEL), 2010 IEEE 12th Workshop on
  • Conference_Location
    Boulder, CO
  • Print_ISBN
    978-1-4244-7462-2
  • Electronic_ISBN
    978-1-4244-7461-5
  • Type

    conf

  • DOI
    10.1109/COMPEL.2010.5562380
  • Filename
    5562380