DocumentCode :
1904798
Title :
Statistical design of integrated circuits using maximum likelihood estimation of the covariance matrix
Author :
Seifi, A. ; Vlach, J. ; Ponnambalam, K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
Volume :
6
fYear :
1998
fDate :
31 May-3 Jun 1998
Firstpage :
338
Abstract :
A new formulation is proposed for statistical design of integrated circuits with correlated input parameters. The method uses a polyhedral approximation of the feasible region and finds the maximum volume ellipsoid contained in that polyhedron. The orientation of the ellipsoid is fixed by a maximum likelihood estimate (MLE) of the correlation matrix. The ellipsoid center is a nominal design with the maximum yield. The covariance estimation is formulated as a semidefinite program which uses the sampling observations as input data. The design centering problem is presented as a second-order cone programming and solved by a special interior-point optimization algorithm. The optimal design of a switched-capacitor filter is presented
Keywords :
circuit optimisation; covariance analysis; covariance matrices; integrated circuit design; maximum likelihood estimation; switched capacitor filters; IC design; correlated input parameters; covariance matrix; design centering problem; interior-point optimization algorithm; maximum likelihood estimation; maximum volume ellipsoid; polyhedral approximation; sampling observations; second-order cone programming; semidefinite program; statistical design; switched-capacitor filter; Algorithm design and analysis; Covariance matrix; Design optimization; Ellipsoids; Entropy; Filters; Input variables; Linear approximation; Maximum likelihood estimation; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-4455-3
Type :
conf
DOI :
10.1109/ISCAS.1998.705280
Filename :
705280
Link To Document :
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