DocumentCode :
1904850
Title :
Characterization of Intermetallic Compounds in Al-Cu-Bimetallic Interfaces
Author :
Pfeifer, S. ; Grossmann, S. ; Freudenberger, R. ; Willing, H. ; Kappl, H.
Author_Institution :
Inst. of Electr. Power Syst. & High Voltage Eng., Tech. Univ. Dresden, Dresden, Germany
fYear :
2012
fDate :
23-26 Sept. 2012
Firstpage :
1
Lastpage :
6
Abstract :
Intermetallic compounds (IMC) resulting from interdiffusion processes at bimetal joints or coated metals usually have worse electrical and mechanical properties compared to the pure metals (e.g. higher specific electric resistance, high brittleness). For a better understanding of the aging of Al-Cu bimetallic joints by interdiffusion, an extensive characterization of the IMC´s physical properties is necessary. For that purpose, phase-pure samples of three phases (AlCu, Al2Cu and Al4Cu9) have been prepared by different processes such as physical vapor deposition or electrochemical deposition. The transition from ductile to brittle behavior complicates the mechanical handling of the samples and some phases could not be prepared in pure form, yet. By adjusting and optimizing the manufacturing processes and the development of a suitable experimental setup, first results for the characterization of IMC´s electrical properties were obtained. Established values for the specific electric resistance of the phase AlCu could not be confirmed. In a further step, the so far poorly studied temperature coefficient of resistivity of each IMP will be determined.
Keywords :
aluminium alloys; bimetals; copper alloys; electric resistance; vapour deposition; Al-Cu; IMC; bimetal joints; bimetallic interfaces; coated metals; electrochemical deposition; interdiffusion process; intermetallic compounds; manufacturing process; physical vapor deposition; Compounds; Copper; Electrical resistance measurement; Joints; Resistance; Substrates; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts (Holm), 2012 IEEE 58th Holm Conference on
Conference_Location :
Portland, OR
ISSN :
1062-6808
Print_ISBN :
978-1-4673-0778-9
Type :
conf
DOI :
10.1109/HOLM.2012.6336554
Filename :
6336554
Link To Document :
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