• DocumentCode
    1905002
  • Title

    Study on the Reason for Difference of Data-Driven and Covariance-driven Stochastic Subspace Identification Method

  • Author

    Xin, Junfeng ; Sheng, Jinlu ; Sui, Weibang

  • Author_Institution
    Eng. Coll., Ocean Univ. of China, Qingdao, China
  • Volume
    3
  • fYear
    2012
  • fDate
    23-25 March 2012
  • Firstpage
    356
  • Lastpage
    360
  • Abstract
    Parameter identification is currently one of the main research topics in the area of structural health monitoring. Stochastic subspace identification method can effectively identify modal parameters of linear structure from structure of ambient vibration. According to difference on the way processing response data, stochastic subspace identification method is divided into data-driven and covariance-driven stochastic subspace identification method, which traditionally is thought to be consistent with each other theoretically and practically. But the fact is that data driven stochastic subspace identification method is different with the covariance driven subspace identification method due to different ways on numerical computation practically. So the study is carried out for the reason why they are different with each other. In the process of analysis, 5-DOF mass-spring-dashpot system is adopted.
  • Keywords
    condition monitoring; covariance analysis; parameter estimation; springs (mechanical); stochastic processes; structural engineering; vibrations; 5-DOF mass spring dashpot system; ambient vibration; covariance-driven stochastic subspace identification method; data-driven stochastic subspace identification method; linear structure; parameter identification; structural health monitoring; Covariance matrix; Educational institutions; Matrix decomposition; Noise; Observability; Stability analysis; Stochastic processes; covariance; data-driven; driven; modal identification; stochastic subspace identification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Electronics Engineering (ICCSEE), 2012 International Conference on
  • Conference_Location
    Hangzhou
  • Print_ISBN
    978-1-4673-0689-8
  • Type

    conf

  • DOI
    10.1109/ICCSEE.2012.75
  • Filename
    6188305