Title :
Measurements and Circuit Model of Carbon Nanofibers at Microwave Frequencies
Author :
Madriz, Francisco R. ; Jameson, John R. ; Krishnan, Shoba ; Gleason, Kris ; Sun, Xuhui ; Yang, Cary Y.
Author_Institution :
Center For Nanostructures, Santa Clara University, 500 El Camino Real, Santa Clara, CA 95053, Phone: +1-408-554-6853, Fax: +1-408-554-5474, e-mail: fmadriz@scu.edu
Abstract :
We study electrical conduction in carbon nanofibers from 0.1 to 30 GHz, by measuring the S-parameters of a ground-signal-ground test structure in which a nanofiber forms part of the signal path. If the nanofiber is modeled as a resistor, the S-parameters are reproduced well by a simple, but realistic, lumped RC circuit model. This implies that, as at low frequencies, nanofibers behave as resistors all the way up to microwave frequencies.
Keywords :
Annealing; Capacitance; Circuit testing; Electrical resistance measurement; Frequency measurement; Microwave circuits; Microwave frequencies; Microwave measurements; Resistors; Scattering parameters;
Conference_Titel :
Interconnect Technology Conference, 2008. IITC 2008. International
Conference_Location :
Burlingame, CA, USA
Print_ISBN :
978-1-4244-1911-1
Electronic_ISBN :
978-1-4244-1912-8
DOI :
10.1109/IITC.2008.4546948
