DocumentCode :
1905125
Title :
Signature verification using local directional pattern (LDP)
Author :
Ferrer, Miguel A. ; Vargas, Francisco ; Travieso, Carlos M. ; Alonso, Jesus B.
Author_Institution :
Dept. de Senales y Comun., Inst. Univ. para el Desarrollo Tecnol. y la Innovacion en Comun., Las Palmas, Spain
fYear :
2010
fDate :
5-8 Oct. 2010
Firstpage :
336
Lastpage :
340
Abstract :
A method for Off-line handwritten signature verification is described in this paper. Recently, several papers have proposed pseudo dynamic methods based on the ink deposition process to discriminate between genuine and fake signatures. The major problem of those methods is the ink texture normalization in order to make the system invariable to the pen. The more extreme pen normalization is the binarization. This paper explores the usefulness of texture based measures with binarized signatures. In particularly, it proposes to apply the gray scale features local binary pattern (LBP) and local directional pattern (LDP) features to characterize black and white static signatures. The experiments done with MCYT75, GPDS300signature and GPDS960signature corpus shown that LDP are very adequate parameters for automatic verification of black and white static signatures. The results are obtained training a Support Vector Machine (SVM) classifier with genuine samples and random forgeries while random and skilled forgeries have been used for testing it.
Keywords :
handwriting recognition; image classification; image texture; support vector machines; GPDS300 signature; GPDS960 signature; MCYT75 signature; SVM classifier; automatic verification; extreme pen normalization; fake signatures; gray scale features local binary pattern; ink deposition process; ink texture normalization; local directional pattern; offline handwritten signature verification; pseudo dynamic method; support vector machine; texture based measures; Databases; Forgery; Image segmentation; Robustness; Training; Gray level information; Local directional pattern; Off-line handwritten signature verification; Pattern recognition; SVM; Texture features;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Security Technology (ICCST), 2010 IEEE International Carnahan Conference on
Conference_Location :
San Jose, CA
ISSN :
1071-6572
Print_ISBN :
978-1-4244-7403-5
Type :
conf
DOI :
10.1109/CCST.2010.5678680
Filename :
5678680
Link To Document :
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