Title :
Efficient identification of major contributions to EMI-induced rectification effects in analog automotive circuits
Author :
Loeckx, Johan ; Gielen, Georges
Author_Institution :
ESAT/MICAS, KU Leuven Univ.
fDate :
Feb. 27 2006-March 3 2006
Abstract :
Rectification is a major cause of failure in EMC susceptibility measurements of analog automotive circuits. Especially charge pumping, the change of a DC operating point due to interference, is a harmful effect. In this paper, a methodology is proposed that gives an estimate of the DC voltage shifts caused by conducted interference with relation to frequency, as well as the contributions of each device. This way, the designer can identify the effects and underlying causes of rectification easily and quickly. The approach is much faster than traditional transient analysis, and time complexity is independent of the frequency of the electromagnetic interference
Keywords :
analogue circuits; automotive components; electromagnetic compatibility; electromagnetic interference; rectification; DC voltage shifts; EMC susceptibility; EMI-induced rectification; analog automotive circuits; conducted interference; electromagnetic interference; time complexity; traditional transient analysis; Automotive engineering; Charge pumps; Circuits; Costs; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic radiative interference; Frequency estimation; Immunity testing; Transient analysis;
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC-Zurich 2006. 17th International Zurich Symposium on
Conference_Location :
Singapore
Print_ISBN :
3-9522990-3-0
DOI :
10.1109/EMCZUR.2006.214891