DocumentCode :
1905482
Title :
Frequency comb metrology at PHz frequencies: Precision in the extreme ultraviolet
Author :
Gohle, Ch ; Kandula, D.Z. ; Pinkert, T.J. ; Morgenweg, J. ; Barmes, I. ; Ubachs, W. ; Eikema, K.S.E.
Author_Institution :
LaserLaB Amsterdam, VU Univ., Amsterdam, Netherlands
fYear :
2011
fDate :
13-20 Aug. 2011
Firstpage :
1
Lastpage :
4
Abstract :
The capability of frequency-comb (FC) lasers to precisely measure optical frequencies is extended to the multiple-PHz domain. This frequency region, which covers the extreme ultraviolet (XUV, wavelengths shorter than 100 nm), was previously not accessible to these devices. Frequency comb generation is shown for 51-85 nm by amplification and coherent up-conversion of a pair of pulses originating from a near-infrared femtosecond FC laser. Moreover, Ramsey-like signals with up to 61% contrast are observed when the XUV comb is scanned over transitions in argon, neon and helium, resulting in an 8-fold improved determination of the ground state ionization energy of helium.
Keywords :
argon; frequency measurement; helium; lasers; measurement by laser beam; neon; Ar; He; Ne; Ramsey-like signals; XUV comb; frequency comb generation; frequency comb metrology; frequency-comb lasers; ground state ionization energy; near-infrared femtosecond FC laser; optical frequency measurement; wavelength 51 nm to 85 nm; Frequency modulation; Helium; Metrology; Ultraviolet sources;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
General Assembly and Scientific Symposium, 2011 XXXth URSI
Conference_Location :
Istanbul
Print_ISBN :
978-1-4244-5117-3
Type :
conf
DOI :
10.1109/URSIGASS.2011.6050328
Filename :
6050328
Link To Document :
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