• DocumentCode
    1905836
  • Title

    Design of low noise CMOS OEIC for blu-ray disc optical storage systems

  • Author

    Giardina, M. ; Stek, A. ; de Jong, G.W. ; Bergervoet, J.R.M.

  • Author_Institution
    Philips Res., Eindhoven, Netherlands
  • fYear
    2004
  • fDate
    21-23 Sept. 2004
  • Firstpage
    271
  • Lastpage
    274
  • Abstract
    This paper discusses the design of an optoelectronic integrated circuit (OEIC intended for optical recording systems. The electronic noise in the system is an issue for high-speed operation and dual-layer blu-ray discs. In order to get a good impression of the various noise sources in the system, a noise calculation model has been developed. The design of the photo-diode and the preamplifiers in a BiCMOS/CMOS processes is discussed. The advantage of CMOS downscaling on the speed race is reported. A novel low-noise, low-voltage and low-power CMOS topology is described. Furthermore, some preliminary results of a test OEIC in 0.18 μm CMOS are also reported. The measured input-referred current noise is 350 fAHz-12/ at 20 MHz equivalent with the shot-noise level generated by a photo current of 380 nA. The active area of the test die, excluding bonding pads, is 0.36×0.26 mm2 and the power consumption is 12.5 mW from a 1.5 V supply voltage at room temperature.
  • Keywords
    CMOS integrated circuits; integrated circuit noise; integrated optoelectronics; low-power electronics; optical disc storage; optical receivers; photodiodes; preamplifiers; shot noise; 0.18 micron; 0.26 mm; 0.36 mm; 1.5 V; 12.5 mW; 20 MHz; 380 nA; BiCMOS; blu-ray disc optical storage systems; dual-layer blu-ray discs; input-referred current noise; low noise CMOS OEIC; low-noise topology; low-voltage topology; noise calculation model; optical recording systems; optoelectronic integrated circuit; photo current generated shot-noise; photo-diode; preamplifiers; speed race; system noise sources; High speed optical techniques; Integrated circuit noise; Optical design; Optical noise; Optical recording; Optoelectronic devices; Photonic integrated circuits; Preamplifiers; Semiconductor device modeling; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2004. ESSCIRC 2004. Proceeding of the 30th European
  • Print_ISBN
    0-7803-8480-6
  • Type

    conf

  • DOI
    10.1109/ESSCIR.2004.1356670
  • Filename
    1356670