DocumentCode :
1905836
Title :
Design of low noise CMOS OEIC for blu-ray disc optical storage systems
Author :
Giardina, M. ; Stek, A. ; de Jong, G.W. ; Bergervoet, J.R.M.
Author_Institution :
Philips Res., Eindhoven, Netherlands
fYear :
2004
fDate :
21-23 Sept. 2004
Firstpage :
271
Lastpage :
274
Abstract :
This paper discusses the design of an optoelectronic integrated circuit (OEIC intended for optical recording systems. The electronic noise in the system is an issue for high-speed operation and dual-layer blu-ray discs. In order to get a good impression of the various noise sources in the system, a noise calculation model has been developed. The design of the photo-diode and the preamplifiers in a BiCMOS/CMOS processes is discussed. The advantage of CMOS downscaling on the speed race is reported. A novel low-noise, low-voltage and low-power CMOS topology is described. Furthermore, some preliminary results of a test OEIC in 0.18 μm CMOS are also reported. The measured input-referred current noise is 350 fAHz-12/ at 20 MHz equivalent with the shot-noise level generated by a photo current of 380 nA. The active area of the test die, excluding bonding pads, is 0.36×0.26 mm2 and the power consumption is 12.5 mW from a 1.5 V supply voltage at room temperature.
Keywords :
CMOS integrated circuits; integrated circuit noise; integrated optoelectronics; low-power electronics; optical disc storage; optical receivers; photodiodes; preamplifiers; shot noise; 0.18 micron; 0.26 mm; 0.36 mm; 1.5 V; 12.5 mW; 20 MHz; 380 nA; BiCMOS; blu-ray disc optical storage systems; dual-layer blu-ray discs; input-referred current noise; low noise CMOS OEIC; low-noise topology; low-voltage topology; noise calculation model; optical recording systems; optoelectronic integrated circuit; photo current generated shot-noise; photo-diode; preamplifiers; speed race; system noise sources; High speed optical techniques; Integrated circuit noise; Optical design; Optical noise; Optical recording; Optoelectronic devices; Photonic integrated circuits; Preamplifiers; Semiconductor device modeling; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2004. ESSCIRC 2004. Proceeding of the 30th European
Print_ISBN :
0-7803-8480-6
Type :
conf
DOI :
10.1109/ESSCIR.2004.1356670
Filename :
1356670
Link To Document :
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