DocumentCode
1905854
Title
Whisker Prevention Using Hard Metal Cap Layers
Author
Crandall, E.R. ; Flowers, G.T. ; Lall, P. ; Bozack, M.J.
Author_Institution
Center for Adv. Vehicle & Extreme Environ. Electron. (CAVE3), Auburn Univ., Auburn, AL, USA
fYear
2012
fDate
23-26 Sept. 2012
Firstpage
1
Lastpage
6
Abstract
Application of conformal coatings has shown promise as a practical scheme for preventing whisker growth in electronic assemblies. Coatings have been proposed utilizing elastomeric, ceramic, and metallic materials. The ability to prevent whiskers is particularly important in assemblies containing Pb-free materials and finishes. Further, many otherwise desirable COTS (commercial off the shelf) electronic components and assemblies are available only with Pb-free tin as the termination finish or Pb-free SAC solder balls under BGAs. In this work we have investigated a variety of proposed whisker-impenetrable hard metal caps through use of Auger electron spectroscopy (AES) and Rutherford backscattering spectroscopy (RBS) and discuss plausible reasons why only certain metals are effective in blocking Sn whiskers.
Keywords
Auger electron spectroscopy; Rutherford backscattering; assembling; ball grid arrays; whiskers (crystal); Auger electron spectroscopy; BGA; COTS electronic components; RBS; Rutherford backscattering spectroscopy; ceramic materials; commercial off the shelf electronic components; conformal coatings; elastomeric materials; electronic assemblies; hard metal cap layers; lead-free SAC solder balls; lead-free finishes; lead-free materials; lead-free tin; metallic materials; tin whisker blocking; whisker growth prevention; whisker-impenetrable hard metal caps; Films; Gold; Lead; Nickel; Spectroscopy; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts (Holm), 2012 IEEE 58th Holm Conference on
Conference_Location
Portland, OR
ISSN
1062-6808
Print_ISBN
978-1-4673-0778-9
Type
conf
DOI
10.1109/HOLM.2012.6336596
Filename
6336596
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