DocumentCode
1905964
Title
Improving test strategies and fault isolation with expert systems
Author
Ben-Bassat, Moshe ; Beniaminy, Israel ; Joseph, David
Author_Institution
IET Intelligent Electron., Anaheim, CA, USA
fYear
1997
fDate
22-25 Sep 1997
Firstpage
467
Lastpage
474
Abstract
This paper focuses on the use of commercial off-the-shelf (COTS) expert systems in integrated diagnostics (1D) for military applications. Expert systems have developed and matured over the past several years to become a viable tool capable of functioning as a procedural tool for identifying diagnostic requirements, analyzing test system capabilities, and providing seamless diagnostic data transfer from requirement to analysis to operations. The most important differentiating characteristics of expert systems are their modeling methods, and their architecture. The modeling method drastically affects the time required to build a model, and the architecture must be open enough to integrate with the many tools used in engineering, deployment, and maintenance of the supported equipment throughout its life cycle. In this article, we present the Fault Modeling method, which has been field-proven over the past decade as flexible enough to meet the challenges of different lifecycle tasks, as well as lending itself to learning-self-improvement over time, even when starting with no knowledge. Expert systems using this model feature rapid deployment, and are able to cover the entire ID process including: capture of existing data, analysis of fault detection and isolation capabilities of the unit under test, and a means to assess diagnostic system designs early in the development phase. The systems integrate easily with simulators, automatic test equipment (ATE), and portable maintenance aid (PMA) equipment
Keywords
automatic test equipment; diagnostic expert systems; maintenance engineering; military computing; military systems; ATE; COTS; Fault Modeling; ID process; automatic test equipment; expert systems; fault detection; fault detection and isolation; fault isolation; integrated diagnostics; lifecycle; military applications; portable maintenance aid; seamless diagnostic data transfer; self-improvement; test strategies; Automatic test equipment; Automatic testing; Costs; Design automation; Design engineering; Diagnostic expert systems; Expert systems; Maintenance; Power system modeling; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
Conference_Location
Anaheim, CA
Print_ISBN
0-7803-4162-7
Type
conf
DOI
10.1109/AUTEST.1997.633660
Filename
633660
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