Title :
I2MTC 2008 Tutorials
Abstract :
Provides an abstract for each of the presentations and a brief professional biography of each presenter. The complete presentations were not made available for publication as part of the conference proceedings.
Keywords :
Frequency measurement; Instruments; Microwave measurements; Microwave technology; Millimeter wave measurements; Noise measurement; Semiconductor device measurement; Sensor systems and applications; Time measurement; USA Councils;
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
Conference_Location :
Victoria, BC
Print_ISBN :
978-1-4244-1540-3
DOI :
10.1109/IMTC.2008.4546991
